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Confinement of Charge Carriers and Excitons in Electrophosphorescent Devices: Mechanism of Light Emission and Degradation

✍ Scribed by B. D. Chin; C. Lee

Publisher: John Wiley and Sons
Year: 2007
Tongue: English
Weight: 313 KB
Volume: 19
Category: Article
ISSN: 0935-9648
DOI: 10.1002/adma.200602509

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