Confidence limits on the failure rate and a rapid projection nomogram for the lognormal distribution : A. S. Jordan. Microelectron. Reliab.24, 101 (1984)

• Publisher: Elsevier Science
• Year: 1985
• Tongue: English
• Weight: 123 KB
• Volume: 25
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(85)90047-2