Conductivity measurements during the crystallization of Bi2S3in Ge20Bi15S65glass
✍ Scribed by J. Málek; J. Klikorka; L. Tichý
- Publisher
- Springer
- Year
- 1986
- Tongue
- English
- Weight
- 198 KB
- Volume
- 5
- Category
- Article
- ISSN
- 0261-8028
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We have measured Young's modulus in ribbon-like whisker samples of the high-T¢ materials: BizSreCaCuzOx and Bi2Sr2Ca2Cu30~. This is the first direct measurement of Young's modulus for whiskers of any of the high T,. materials. We used a stress-strain probe that applies an axial force (uniaxial stres
## Abstract Absolute intensity measurements of a dynamic small‐angle x‐ray scattering from a linear polyethylene were carried out during polymer crystallization from melt in a temperature range of 113.5° to 124.5°C. The mean‐square modulation of the electron density over the irradiated volume was e