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Conduction properties of electrically erasable read only memory tunnel oxides under dynamic stress

✍ Scribed by C. Plossu; S. Croci; N. Monti; R. Bouchakour; R. Laffont; Ph. Boivin; J.M. Mirabel

Book ID: 117144725
Publisher: Elsevier Science
Year: 2001
Tongue: English
Weight: 587 KB
Volume: 280
Category: Article
ISSN: 0022-3093
DOI: 10.1016/s0022-3093(00)00360-4

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