Conduction mechanisms in barium tantalates films and modification of interfacial barrier height

✍ Scribed by Yun-Hi Lee; Young-Sik Kim; Dong-Ho Kim; Byeong-Kwon Ju; Myung-Hwan Oh

• Book ID: 114537993
• Publisher: IEEE
• Year: 2000
• Tongue: English
• Weight: 162 KB
• Volume: 47
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/16.817569