Conducting tip atomic force microscopy analysis of aluminum oxide barrier defects decorated by electrodeposition

✍ Scribed by Carrey, J.; Bouzehouane, K.; George, J.-M.; Ceneray, C.; Fert, A.; Vaurès, A.; Kenane, S.; Piraux, L.

• Book ID: 120525758
• Publisher: American Institute of Physics
• Year: 2001
• Tongue: English
• Weight: 297 KB
• Volume: 79
• Category: Article
• ISSN: 0003-6951
• DOI: 10.1063/1.1415775