✦ LIBER ✦
Conductance fluctuations in solids caused by defect migration : V. B. Orlov. Solid-State Electronics, 35(12), 1827 (1992)
- Publisher
- Elsevier Science
- Year
- 1993
- Tongue
- English
- Weight
- 112 KB
- Volume
- 33
- Category
- Article
- ISSN
- 0026-2714
No coin nor oath required. For personal study only.