Scaling properties of universal conducta
โ
Y. Ochiai; K. Yamamoto; T. Onishi; K. Ishibashi; J.P. Bird; Y. Aoyagi; T. Sugano
๐
Article
๐
1994
๐
Elsevier Science
๐
English
โ 130 KB
We study the scaling properties of universal conductance fluctuations, observed in the magneto-resistance of quasi ballistic, split gate wires. In such devices the correlation field analysis is not simply determined by theoretical predictions for corresponding diffusive systems, and we discuss this