𝔖 Bobbio Scriptorium

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Concentration profiles of implanted phosphorus in silicon: F Burkhardt et al, Phys Stat Sol (a), 22 (1), 1974, K45–K47

Publisher: Elsevier Science
Year: 1975
Tongue: English
Weight: 162 KB
Volume: 25
Category: Article
ISSN: 0042-207X
DOI: 10.1016/0042-207x(75)91462-1

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