Concentration of uncompensated impurities as a key parameter of CdTe and CdZnTe crystals for Schottky diode x\ssty{/}γ-ray detectors

✍ Scribed by Kosyachenko, L A; Lambropoulos, C P; Aoki, T; Dieguez, E; Fiederle, M; Loukas, D; Sklyarchuk, O V; Maslyanchuk, O L; Grushko, E V; Sklyarchuk, V M; Crocco, J; Bensalah, H

• Book ID: 124083396
• Publisher: Institute of Physics
• Year: 2011
• Tongue: English
• Weight: 633 KB
• Volume: 27
• Category: Article
• ISSN: 0268-1242
• DOI: 10.1088/0268-1242/27/1/015007