Computing Multi-State Two-Terminal Reliability Through Critical Arc States That Interrupt Demand

✍ Scribed by Chin-Chia Jane; Yih-Wenn Laih

• Book ID: 114668827
• Publisher: IEEE
• Year: 2010
• Tongue: English
• Weight: 249 KB
• Volume: 59
• Category: Article
• ISSN: 0018-9529
• DOI: 10.1109/tr.2010.2046805