Computerized apparatus for examining and certifying devices for determining the time parameters of measurement-system signals

✍ Scribed by D. A. Efremenko; I. A. Malevich; E. I. Tabachnik

• Publisher: Springer US
• Year: 1987
• Tongue: English
• Weight: 323 KB
• Volume: 30
• Category: Article
• ISSN: 0543-1972
• DOI: 10.1007/bf00867060