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Computer study of the phase-locking characteristics of the LSA-mode transferred-electron-effect diode oscillator

✍ Scribed by Tan, H.S.


Book ID
114590461
Publisher
IEEE
Year
1973
Tongue
English
Weight
403 KB
Volume
20
Category
Article
ISSN
0018-9383

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A numerical study of chaos in transferre
✍ H. R. Farrah; M. P. Shaw πŸ“‚ Article πŸ“… 1996 πŸ› John Wiley and Sons 🌐 English βš– 458 KB πŸ‘ 3 views

A model of a transferred electron device including reactive circuit elements and realistic boundary conditions is used to study chaos. We find that any simulation of chaos is suspect if the external circuit and cathode bounda ry conditions are ignored; including them reduces the range ofparameters i