Computer simulation of the sputtering-induced composition change in CuAu, CuNi and CuPd alloys in the initial period of depth profiling

✍ Scribed by L Füstöss; J László; J Giber

• Publisher: Elsevier Science
• Year: 1983
• Tongue: English
• Weight: 382 KB
• Volume: 33
• Category: Article
• ISSN: 0042-207X
• DOI: 10.1016/0042-207x(83)90543-2