✦ LIBER ✦
Computer Simulation and AFM Characterization of Standard and Irradiated Si PIN Devices
✍ Scribed by Arie Ruzin; I. Torchinsky
- Book ID
- 103868215
- Publisher
- Elsevier Science
- Year
- 2006
- Tongue
- English
- Weight
- 211 KB
- Volume
- 150
- Category
- Article
- ISSN
- 0920-5632
No coin nor oath required. For personal study only.