KOPSKO: a Computer Program for Generatio
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E. Langer; R. Kurt; S. DΓ€britz
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Article
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1999
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John Wiley and Sons
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English
β 503 KB
Diffraction techniques are widely used especially as additional tools for analytical microprobe analysis. A supplementary device to a scanning electron microscope (SEM) allows taking of X-ray lattice source and wide angle interference patterns, now termed Kossel and Pseudo Kossel patterns, respectiv