𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Computer analysis of step-scanned X-ray data

✍ Scribed by Blessing, R. H. ;Coppens, P. ;Becker, P.

Book ID
114498249
Publisher
International Union of Crystallography
Year
1974
Tongue
English
Weight
536 KB
Volume
7
Category
Article
ISSN
0021-8898

No coin nor oath required. For personal study only.

πŸ“œ SIMILAR VOLUMES

X-ray step scanning topography
X-ray step scanning topography
✍ Andersen, A. L. ;Gerward, L. πŸ“‚ Article πŸ“… 1974 πŸ› John Wiley and Sons 🌐 English βš– 438 KB
Features of dislocation images reconstru
Features of dislocation images reconstructed from step-scanned white X-ray section topographs
✍ Kajiwara, Kentaro ;Kawado, Seiji ;Iida, Satoshi ;Suzuki, Yoshifumi ;Chikaura, Yo πŸ“‚ Article πŸ“… 2007 πŸ› John Wiley and Sons 🌐 English βš– 350 KB

## Abstract We have observed dislocations in a CZ‐silicon crystal using step‐scanning white X‐ray section topography and examined the feature of the dislocation images reconstructed by stacking 200 shots of sec‐ tion topographs. These topographs were obtained from symmetric 004‐reflection in the La

Computer analysis of X-ray spectra
Computer analysis of X-ray spectra
✍ M.J. Nass; A. Lurio; J.F. Ziegler πŸ“‚ Article πŸ“… 1978 πŸ› Elsevier Science βš– 377 KB