Computer-aided sequential testing for equipment reliability : G. Lafond. Microelectron. & Reliab.13, 477 (1974)

• Publisher: Elsevier Science
• Year: 1975
• Tongue: English
• Weight: 131 KB
• Volume: 14
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(75)90540-5