Computer aided reliability modelling and applications in semiconductor manufacturing : Baris Tan, Sencer Yeralan, Sailesh Babu and Brock Osborn. Computers and Industrial Engineering, 23(1–4), 169 (1992)

• Book ID: 103284679
• Publisher: Elsevier Science
• Year: 1993
• Tongue: English
• Weight: 111 KB
• Volume: 33
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(93)90392-c