Computer-aided interferometer for testing microdisplacement of piezoelectric ceramics

✍ Scribed by Yu Zhu; Jingbang Chen; Qing Wang; Lei Chen; Rihong Zhu

• Publisher: John Wiley and Sons
• Year: 1999
• Tongue: English
• Weight: 113 KB
• Volume: 22
• Category: Article
• ISSN: 0895-2477
• DOI: 10.1002/(sici)1098-2760(19990705)22:1<72::aid-mop18>3.0.co;2-w

✦ Synopsis

This paper proposes a kind of computer-aided contact-type interferometer for testing the microdisplacement of piezoelectric ceramics ( ) PZT . Its accuracy is better than 0.01 m. A data acquisition system, including a CCD, grabber, etc., has been used to detect and digitize interferograms. This system analyzes a two-dimensional interferogram automatically and quickly, while both calibrate with monochromatic fringes and test with achromatic fringes. Software has been used to analyze the two-dimensional interferogram and to test the nonlinearity and hysteresis of PZT.