Computer aided circuit reliability analysis : B. O. Allen, D. R. Blazek and C. H. Purdue. Proceedings Eleventh National Symposium on Reliability and Quality Control, Miami Beach, Florida, January 1965, pp. 21–33

• Book ID: 113190176
• Publisher: Elsevier Science
• Year: 1965
• Tongue: English
• Weight: 96 KB
• Volume: 4
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(65)90186-1