๐”– Scriptorium
โœฆ   LIBER   โœฆ

๐Ÿ“

Computed Electron Micrographs and Defect Identification

โœ Scribed by A.K. HEAD, P. HUMBLE, L.M. CLAREBROUGH, A.J. MORTON and C.T. FORWOOD (Eds.)


Publisher
Elsevier Science Publishing Co Inc.,U.S
Year
1973
Tongue
English
Leaves
400
Series
Defects in Crystalline Solids 7
Category
Library

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โœฆ Table of Contents


Content:
Series: Defects in Crystalline Solids
Page II

Front Matter
Page III

Copyright page
Page IV

Preface
Pages V-VI

1 - Introduction
Pages 1-6

2 - Introduction to the Basic Theory
Pages 7-38

3 - Experimental Techniques
Pages 39-84

4 - Principles of Onedis
Pages 85-123

5 - Matching with Onedis
Pages 125-143

6 - Principles of Twodis
Pages 145-173

7 - Matching with Twodis
Pages 175-200

8 - Applications of the Technique
Pages 201-222,222a,223-287

9 - Discussion of the Applications and Limitations of the Technique
Pages 289-308

10 - Computer Programs
Pages 309-375

Appendix
Pages 377-386

References
Pages 387-389

Subject Index
Pages 391-400


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