<p>This monograph contains over fifty high-quality plates of electron micrographs of limestones. It spans the field of limestones in age from Cambrian to Recent, and in type from deep-sea oozes to intertidal rocks. It represents the outcome of four years of research in the new field of electron micr
Computed Electron Micrographs and Defect Identification
โ Scribed by A.K. HEAD, P. HUMBLE, L.M. CLAREBROUGH, A.J. MORTON and C.T. FORWOOD (Eds.)
- Publisher
- Elsevier Science Publishing Co Inc.,U.S
- Year
- 1973
- Tongue
- English
- Leaves
- 400
- Series
- Defects in Crystalline Solids 7
- Category
- Library
No coin nor oath required. For personal study only.
โฆ Table of Contents
Content:
Series: Defects in Crystalline Solids
Page II
Front Matter
Page III
Copyright page
Page IV
Preface
Pages V-VI
1 - Introduction
Pages 1-6
2 - Introduction to the Basic Theory
Pages 7-38
3 - Experimental Techniques
Pages 39-84
4 - Principles of Onedis
Pages 85-123
5 - Matching with Onedis
Pages 125-143
6 - Principles of Twodis
Pages 145-173
7 - Matching with Twodis
Pages 175-200
8 - Applications of the Technique
Pages 201-222,222a,223-287
9 - Discussion of the Applications and Limitations of the Technique
Pages 289-308
10 - Computer Programs
Pages 309-375
Appendix
Pages 377-386
References
Pages 387-389
Subject Index
Pages 391-400
๐ SIMILAR VOLUMES
The principal aim of this book is to provide the reader with the understanding of the possibilities and features of THz identification as opposed to more traditional techniques such as X-rays, microwaves, etc. by elucidating and illustrating the principles of THz identification and its applications