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Computational Method for Determining n and k for a Thin Film from the Measured Reflectance, Transmittance, and Film Thickness

✍ Scribed by Bennett, Jean M. ;Booty, Maxine J.


Book ID
115318561
Publisher
The Optical Society
Year
1966
Tongue
English
Weight
567 KB
Volume
5
Category
Article
ISSN
1559-128X

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