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Computation of the field diffracted by a local surface defect: application to tip-sample interaction in the photon scanning tunneling microscope

✍ Scribed by Weeber, J. C.; deFornel, F.; Goudonnet, J. P.


Book ID
115387838
Publisher
Optical Society of America
Year
1996
Tongue
English
Weight
506 KB
Volume
13
Category
Article
ISSN
1084-7529

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