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Compromise of electrical leakage and capacitance density effects: a facile route for high mobility and sharp subthreshold slope in low-voltage operable organic field-effect transistors

✍ Scribed by Xu, Wentao; Rhee, Shi-Woo


Book ID
111871320
Publisher
Royal Society of Chemistry
Year
2011
Tongue
English
Weight
228 KB
Volume
21
Category
Article
ISSN
0959-9428

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