Comprehensive Study on the Bias-Dependent Equivalent-Circuit Elements Affected by PECVD SiN Passivation in AlGaN/GaN HEMTs

✍ Scribed by Zhi Hong Liu; Geok Ing Ng; Arulkumaran, S.; Ye Kyaw Thu Maung; Khoon Leng Teo; Siew Chuen Foo; Sahmuganathan, V.

• Book ID: 114620312
• Publisher: IEEE
• Year: 2011
• Tongue: English
• Weight: 849 KB
• Volume: 58
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2010.2093144