Comprehensive study on low-frequency noise characteristics in surface channel SOI CMOSFETs and device design optimization for RF ICs

✍ Scribed by Ying-Che Tseng; Huang, W.M.; Mendicino, M.; Monk, D.J.; Welch, P.J.; Woo, J.C.S.

• Book ID: 114538739
• Publisher: IEEE
• Year: 2001
• Tongue: English
• Weight: 304 KB
• Volume: 48
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/16.930662