✦ LIBER ✦
Comprehensive Investigation of Statistical Effects in Nitride Memories—Part II: Scaling Analysis and Impact on Device Performance
✍ Scribed by Monzio Compagnoni, C.; Mauri, A.; Amoroso, S.M.; Maconi, A.; Greco, E.; Spinelli, A.S.; Lacaita, A.L.
- Book ID
- 114620091
- Publisher
- IEEE
- Year
- 2010
- Tongue
- English
- Weight
- 583 KB
- Volume
- 57
- Category
- Article
- ISSN
- 0018-9383
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