Compositional changes in erbium-implanted GaN films due to annealing

✍ Scribed by J. M. Zavada; R. G. Wilson; U. Hömmerich; M. Thaik; J. T. Seo; C. J. Ellis; J. Y. Lin; H. X. Jiang

• Book ID: 107453027
• Publisher: Springer US
• Year: 2003
• Tongue: English
• Weight: 136 KB
• Volume: 32
• Category: Article
• ISSN: 0361-5235
• DOI: 10.1007/s11664-003-0162-7