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Compositional Analysis of Electrodeposited Bismuth Telluride Thermoelectric Thin Films Using Combined Electrochemical Quartz Crystal Microgravimetry−Stripping Voltammetry

✍ Scribed by Ham, Sunyoung; Jeon, Soyeon; Lee, Ungki; Park, Minsoon; Paeng, Ki-Jung; Myung, Noseung; Rajeshwar, Krishnan

Book ID: 126785282
Publisher: American Chemical Society
Year: 2008
Tongue: English
Weight: 189 KB
Volume: 80
Category: Article
ISSN: 0003-2700
DOI: 10.1021/ac8008127

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