Composition of Ni–Ta–C thick films using simulated annealing analysis of elastic backscattering spectrometry data

✍ Scribed by C Jeynes; N.P Barradas; J.R Wilde; A.L Greer

• Book ID: 114171973
• Publisher: Elsevier Science
• Year: 2000
• Tongue: English
• Weight: 145 KB
• Volume: 161-163
• Category: Article
• ISSN: 0168-583X
• DOI: 10.1016/s0168-583x(99)00950-7