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Composition Fluctuations in InGaN Analyzed by Transmission Electron Microscopy

✍ Scribed by Gerthsen, D. ;Hahn, E. ;Neubauer, B. ;Rosenauer, A. ;Sch�n, O. ;Heuken, M. ;Rizzi, A.


Publisher
John Wiley and Sons
Year
2000
Tongue
English
Weight
351 KB
Volume
177
Category
Article
ISSN
0031-8965

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