Composition depth information in organic materials by measurement of XPS background signal

✍ Scribed by Samia Zeggane; Michel Delamar

• Publisher: Elsevier Science
• Year: 1987
• Tongue: English
• Weight: 430 KB
• Volume: 29
• Category: Article
• ISSN: 0169-4332
• DOI: 10.1016/0169-4332(87)90046-8