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Composition Dependence of 63Ni Diffusion in Single-Crystal NiO-MgO Solid Solutions

✍ Scribed by G. C. T. WEI; B. J. WUENSCH


Book ID
110813656
Publisher
John Wiley and Sons
Year
1973
Tongue
English
Weight
562 KB
Volume
56
Category
Article
ISSN
0002-7820

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Tracer diffusion of 44 Ti and 63 Ni in γ-TiAl has been investigated using single crystal samples by the ion-beam sputter-sectioning technique in the temperature range from 1133 to 1307 K and from 1053 to 1278 K, respectively. The tracer diffusion coefficients have been measured in the directions par