Diffusion of 44Ti and 63Ni in TiAl singl
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T Ikeda; H Kadowaki; H Nakajima
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Article
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2001
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Elsevier Science
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English
⚖ 246 KB
Tracer diffusion of 44 Ti and 63 Ni in γ-TiAl has been investigated using single crystal samples by the ion-beam sputter-sectioning technique in the temperature range from 1133 to 1307 K and from 1053 to 1278 K, respectively. The tracer diffusion coefficients have been measured in the directions par