Complex system reliability with general repair time distributions under head-of-line-repair-discipline : P. P. Gupta. Microelectron. & Reliab. 12, 445 (1973)

• Publisher: Elsevier Science
• Year: 1974
• Tongue: English
• Weight: 110 KB
• Volume: 13
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(74)90233-9