𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Complex characterisation of vacuum arc-deposited chromium nitride thin films

✍ Scribed by A. Ehrlich; M. Kühn; F. Richter; W. Hoyer


Book ID
107930459
Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
531 KB
Volume
76-77
Category
Article
ISSN
0257-8972

No coin nor oath required. For personal study only.


📜 SIMILAR VOLUMES


Characterisation of Ni–Ti thin films pro
✍ N. Stanford; S.W. Huang; D. Dunne 📂 Article 📅 2008 🏛 Elsevier Science 🌐 English ⚖ 824 KB

Ti-49.5 at%Ni thin films have been formed by deposition onto Si and glass substrates using a filtered arc deposition system (FADS). The films deposited on glass were composed of nanocrystalline parent phase grains contained within an amorphous matrix. The films deposited onto silicon were crystallin