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Complementary use of PIXE-alpha and XRF portable systems for the non-destructive and in situ characterization of gemstones in museums

✍ Scribed by L. Pappalardo; A.G. Karydas; N. Kotzamani; G. Pappalardo; F.P. Romano; Ch. Zarkadas

Publisher: Elsevier Science
Year: 2005
Tongue: English
Weight: 395 KB
Volume: 239
Category: Article
ISSN: 0168-583X
DOI: 10.1016/j.nimb.2005.06.184

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