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Complementarities of nuclear-based analytical techniques for the characterization of thin film technological materials

✍ Scribed by Samuel Bamford; Peter Kregsamer; Stjepko Fazinic; Milko Jaksic; Dariusz Wegrzynek; Ernesto Chinea-Cano; Andrzej Markowicz

Publisher: Elsevier Science
Year: 2007
Tongue: English
Weight: 317 KB
Volume: 261
Category: Article
ISSN: 0168-583X
DOI: 10.1016/j.nimb.2007.03.066

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