Comparison of X-ray topographical images in implanted silicon crystals at different absorption conditions

✍ Scribed by Dr. Z. Furmanik; Dr. H. Hubrig; M. Maciaszek; I. S. Vassilev

• Publisher: John Wiley and Sons
• Year: 1979
• Tongue: English
• Weight: 450 KB
• Volume: 14
• Category: Article
• ISSN: 0232-1300
• DOI: 10.1002/crat.19790140312