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Comparison of threshold modulation in narrow MOSFETs with different isolation structures

✍ Scribed by P.T. Lai; Y.C. Cheng

Publisher: Elsevier Science
Year: 1985
Tongue: English
Weight: 301 KB
Volume: 28
Category: Article
ISSN: 0038-1101
DOI: 10.1016/0038-1101(85)90124-8

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