Comparison of some physical properties of resistance—heat and electron-gun evaporated SiO films : R. Y. Shimoda, E. J. Hsieh and K. Mayeda, Vacuum18, No. 5 (1968), p. 269

• Publisher: Elsevier Science
• Year: 1969
• Tongue: English
• Weight: 103 KB
• Volume: 8
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(69)90161-9