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Comparison of some methods for timing Si(Li) detectors

โœ Scribed by A. Hofmann; G. Philipp; K. Thomas; F. Vogler


Publisher
Elsevier Science
Year
1972
Weight
250 KB
Volume
101
Category
Article
ISSN
0029-554X

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Estimation of absorbing layer thicknesse
โœ M. Procop ๐Ÿ“‚ Article ๐Ÿ“… 1999 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 182 KB

The absorption edges in the background of an electron excited x-ray spectrum recorded by an Si(Li) detector with a polymer window are used to determine the thicknesses of front contact and dead layers, and also those of absorbing hydrocarbon and ice layers. A careful sample preparation is necessary