Comparison of Shubnikov-de Haas effect and cyclotron resonance on Si(100) MOS transistors under uniaxial stress

✍ Scribed by H. Gesch; G. Dorda; P. Stallhofer; J.P. Kotthaus

• Publisher: Elsevier Science
• Year: 1979
• Tongue: English
• Weight: 368 KB
• Volume: 32
• Category: Article
• ISSN: 0038-1098
• DOI: 10.1016/0038-1098(79)90371-5