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Comparison of radiation effects on the operation of MOS devices under various types of nuclear radiation

✍ Scribed by A.Yu. Didyk; G.G. Gulbekian; W. Wronski

Book ID: 113287310
Publisher: Elsevier Science
Year: 1996
Tongue: English
Weight: 339 KB
Volume: 111
Category: Article
ISSN: 0168-583X
DOI: 10.1016/0168-583x(95)01287-7

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