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Comparison of one- and two-dimensional models of transistor thermal instability

✍ Scribed by Hower, P.L.; Govil, P.K.

Book ID: 114591712
Publisher: IEEE
Year: 1974
Tongue: English
Weight: 690 KB
Volume: 21
Category: Article
ISSN: 0018-9383
DOI: 10.1109/t-ed.1974.17979

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