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Comparison of lifetime and threshold current damage factors for multi-quantum-well (MQW) GaAs/GaAlAs laser diodes irradiated at different proton energies

✍ Scribed by Lee, S.C.; Zhao, Y.F.; Schrimpf, R.D.; Neifeld, M.A.; Galloway, K.F.


Book ID
121181230
Publisher
IEEE
Year
1999
Tongue
English
Weight
465 KB
Volume
46
Category
Article
ISSN
0018-9499

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