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Comparison of extended x-ray absorption fine structure and Scherrer analysis of x-ray diffraction as methods for determining mean sizes of polydisperse nanoparticles

✍ Scribed by S. Calvin; S. X. Luo; C. Caragianis-broadbridge; J. K. Mcguinness; E. Anderson; A. Lehman; K. H. Wee; S. A. Morrison; L. K. Kurihara


Book ID
121773748
Publisher
American Institute of Physics
Year
2005
Tongue
English
Weight
565 KB
Volume
87
Category
Article
ISSN
0003-6951

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