Comparison of Direct Inter-Filament Resistance Measurement on $\hbox{Nb}_{3}\hbox{Sn}$ Strands Between University of Twente and ENEA

✍ Scribed by Zhou, C.; Dhalle, M.; Nijhuis, A.; Breschi, M.; Spina, T.; della Corte, A.; Corato, V.

• Book ID: 118175469
• Publisher: IEEE
• Year: 2013
• Tongue: English
• Weight: 533 KB
• Volume: 23
• Category: Article
• ISSN: 1051-8223
• DOI: 10.1109/tasc.2012.2231133