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Comparison of Diode Noise Under RF and DC Excitations (Short Papers)

✍ Scribed by Lipkin, Y.; Maniv, S.


Book ID
119819616
Publisher
IEEE
Year
1974
Tongue
English
Weight
506 KB
Volume
22
Category
Article
ISSN
0018-9480

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## Abstract Indium–tin‐oxide (ITO) deposited by conventional capacitive RF magnetron sputtering (rf MS), DC facing target sputtering (dc FTS) and two postannealed samples of these were compared. Comparison of the ITOs aimed at investigating the surface and microstructure effect on the electrical an