✦ LIBER ✦
Comparison of depth resolution from a microscopically modulated Rh/C film after sputter profiling by SIMS and SNMS
✍ Scribed by Moens, Monique ;Adams, Fred C.
- Publisher
- Springer-Verlag
- Year
- 1988
- Weight
- 722 KB
- Volume
- 96
- Category
- Article
- ISSN
- 0344-838X
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